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Detection of a History Dependent Topological Hall Effect Due to Skyrmion Formation in FeGe Thin Films
Detection of a History Dependent Topological Hall Effect Due to Skyrmion Formation in FeGe Thin Films
2016
James Gallagher
Michael R. Page
Vidya Bhallamudi
Jack Brangham
Keng Yuan Meng
Bryan D. Esser
Hailong Wang
D.W. McComb
Chris Hammel
Fengyuan Yang
Keywords:
Hall effect
Thin film
Skyrmion
Condensed matter physics
Nuclear magnetic resonance
Physics
Correction
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