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High Resolution X-Ray Spectrometer for Precision EXAFS Measurements in the 6 keV to 15 keV Energy Range
High Resolution X-Ray Spectrometer for Precision EXAFS Measurements in the 6 keV to 15 keV Energy Range
2016
Lawrence T. Hudson
John F. Seely
Albert Henins
U. Feldman
Keywords:
X-ray spectroscopy
Extended X-ray absorption fine structure
Chemistry
Analytical chemistry
Surface-extended X-ray absorption fine structure
high resolution
Materials science
Atomic physics
Correction
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