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Use of Negative Bias Potential for High Throughput Array Tomography in an Integrated Light-Electron Microscope
Use of Negative Bias Potential for High Throughput Array Tomography in an Integrated Light-Electron Microscope
2019
R. Lane
Yoram Vos
Pascal de Boer
Ben N. G. Giepmans
Jacob P. Hoogenboom
Keywords:
Optoelectronics
Analytical chemistry
Throughput
Electron microscope
Materials science
Tomography
negative bias
Correction
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