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Defect Evaluation by Photoluminescence for Uniaxially Strained Si-On-Insulator
Defect Evaluation by Photoluminescence for Uniaxially Strained Si-On-Insulator
2011
Dong Wang
Keisuke Yamamoto
Hongye Gao
Haigui Yang
Hiroshi Nakashima
Keywords:
Insulator (electricity)
Photoluminescence
Nuclear magnetic resonance
Materials science
Optoelectronics
Correction
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