Compendium of Recent SEE, and TID Test Results conducted by CNES from 2011-2016
2017
This paper reports the results and analysis of various total ionizing dose (TID) and single event effects (SEE) tests. The compendium covers devices tested by CNES from 2011 to 2016. The DUTs employed for the study include memories, microprocessors, logic families, converters, linear switches, linear amplifiers and others.
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI