Nanostructured CeO2 thin films: A SAXS study of the interface between grains and pores

Abstract The analysis of the interface between grains and pores in thin films of CeO 2 , prepared by two different sol–gel procedures, was performed using grazing incidence small-angle X-ray scattering. The existence and the average thickness of an interfacial layer, formed during one of the preparation procedures, were examined by analyzing the depletion of scattering intensity in the Porod's scattering region.