The optoelectronic component with scattered radiation

The invention relates to a method of manufacturing the optoelectronic component, a method for testing of the component and the optoelectronic component, wherein the electromagnetic radiation is guided in a guide plane, wherein the electromagnetic radiation is output substantially in the guiding plane, laterally to the guide plane, the active zone write a scattered radiation, wherein an electrical contact surface is provided, wherein the contact surface is arranged outside the guide plane, wherein the contact surface is formed by a surface which is at least partially covered with a conductive layer, wherein the surface has inclined partial surfaces, wherein the electrically conductive layer is formed as thin in at least a subset of the inclined surfaces of the contact surface that stray electromagnetic radiation exits through the subset of the inclined surfaces.