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Reliability Improvement of Charge Trap Flash Memory Cell with Sealing Oxide in Fluorine Incorporation
Reliability Improvement of Charge Trap Flash Memory Cell with Sealing Oxide in Fluorine Incorporation
2019
이승환
이태윤
안현준
이태인
신의중
신성원
조병진
Keywords:
Charge trap flash
Fluorine
Oxide
Memory cell
Materials science
Optoelectronics
Correction
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