Old Web
English
Sign In
Acemap
>
Paper
>
Real time atomic force microscopy growth monitoring during pulsed laser deposition
Real time atomic force microscopy growth monitoring during pulsed laser deposition
2013
W.A. Wessels
Joska Johannes Broekmaat
G.J.C. Baarle
Gertjan Koster
Augustinus J.H.M. Rijnders
Keywords:
Materials science
Atomic force microscopy
Analytical chemistry
Pulsed laser deposition
growth monitoring
Optoelectronics
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]