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Four probe and XPS analysis of Carbon Irradiated RuO2 thin layers
Four probe and XPS analysis of Carbon Irradiated RuO2 thin layers
2004
Changduk Lim
Vaishali Ukirde
William I. Gustafson
Laura J. Mitchell
M. A. Quevedo-Lopez
Mohamed El Bouanani
Keywords:
Chemical composition
Work function
X-ray photoelectron spectroscopy
Copper
Thin layers
Thin film
Inorganic chemistry
Analytical chemistry
Layer by layer
Carbon
Materials science
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