Tuning the \({T}_{\text {C}}\) of Titanium Thin Films for Transition-Edge Sensors by Annealing in Argon

We present critical temperature measurements of titanium thin films annealed in an argon atmosphere at various temperatures. We are able to depress the \({T}_{\text {C}}\) by up to 200 mK from an initial \({T}_{\text {C}}\) of 540 mK by increasing the temperature at which the films are post-annealed from 80 to 275 \(^{\circ }\)C. We find an anti-correlation trend between the annealing temperature and the measured \({T}_{\text {C}}\). We also briefly discuss how we plan to use these films to produce TES detectors to be used in the LSPE/SWIPE balloon-borne cosmic microwave background polarimeter, which is slated to launch in December 2019.