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Еllipsometric studies of homogeniouly of As 2 S 3 chalcogenid glass thin films
Еllipsometric studies of homogeniouly of As 2 S 3 chalcogenid glass thin films
2004
В. М. Жихарєв
М. І. Козак
І. Д. Сейковський
Keywords:
Thin film
Materials science
Composite material
Correction
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