X-ray diffraction study of amorphization along interfaces in polycrystalline Ni/Ti multilayers

Ni/Ti multilayers with composition modulation wavelengths (35 to 110 A) were annealed at 473 K during 8 h and studied by X ray diffraction. Upon annealing, an amorphous phase developed along the interfaces, concurrently with dissolution of Ti in crystalline Ni. The diffusion coefficient was determined, using methods described by Hollanders et al.