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A Fully Automated Dual-Probe Scanning Near-Field Optical Microscopy Technique
A Fully Automated Dual-Probe Scanning Near-Field Optical Microscopy Technique
2017
Najmeh Abbasirad
Kenneth Kollin
Norik Janunts
Frank Setzpfandt
Thomas Pertsch
Keywords:
Scanning confocal electron microscopy
Scanning probe microscopy
Optical microscope
Scanning ion-conductance microscopy
Analytical chemistry
Near and far field
Materials science
dual probe
fully automated
Optics
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