A MODEL FOR THE ELECTRICAL CONDUCTION AND 1/F-NOISE IN CERMET THICK FILM RESISTOR-SYSTEMS
1986
In this paper we report conduction and noise measurements on a cermet and a metallo-organic thick film resistor system. On the basis of a possible conduction mechanism through the resistors, and the justified application of Hooge's formula, we can explain the trends in all parameter dependencies of resistance and noise.
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