A high resolution crystal diffraction spectrometer for X-ray analysis

Abstract A crystal diffraction spectrometer for high resolution X-ray spectroscopy is described. The experimental arrangement of the computer controlled spectrometer allows the use of plane crystals as well as bent ones. Positioning of the analyzer crystal results with a precision better than 3” at a reproducibility of about 1”. The performance of the spectrometer is characterized by selected diffraction spectra and by first physical results, e.g. intensity ratios and asymmetry indices.