Time-Resolved X-Ray Stress Analysis in Multilayered Thin Films during Continuous Loading: Use of 2D Remote Detection

Synchrotron X-ray diffraction is a powerful tool to analyse the mechanical behavior of multiphase materials due to its selectivity. Simultaneous stress analysis of both phases of a W/Cu thin multilayer has been performed during a continuous biaxial loading on DiffAbs beamline at SOLEIL synchrotron (France). The use of a 2D detector with a large sample-detector distance is shown to give relatively accurate applied stress analysis even if only a small part of the usual ψ range of the sin2ψ method is considered. The results show the failure of the thin film multilayer while the W components are still under a strong compressive stress state of-3 GPa. It is concluded that the mechanical behavior is in fact mainly governed by the residual stress state.