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Temperature and Emissivity Determination of Si-BASED Materials by In-Situ Measurements: Application to Catalysis
Temperature and Emissivity Determination of Si-BASED Materials by In-Situ Measurements: Application to Catalysis
2005
A. Desportes
P. Vervisch
Keywords:
Raman spectroscopy
Inductively coupled plasma
Heat flux
Infrared
Catalysis
Boundary layer
Emissivity
Chemistry
In situ
Analytical chemistry
Correction
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