Space charge limited currents and traps distribution in Ag–As–Te thin films glasses

Abstract In this paper, we study the effect of increasing Ag content on the conduction phenomena of Ag x As 50− x Te 50 with 3≤ x ≤20 glass system with a thickness ∼150 nm. The current–voltage ( J–V ) characteristics in the voltage range 0–20 V are measured for all films. The temperature dependence of J–V characteristics are obtained and their results are found to be dependent on the presence of localized state or the trapping levels positioned at a specific energy E t below the conduction band. Therefore, the charge carrier's concentration in each of the conduction bands, the trapping parameter θ , and the trap density N t as a function of Ag content are determined. The transition from ohmic to square low behavior has been used to calculate all of these parameters. It has been found that by increasing the Ag at%, the trap activation energy E t decreases from 0.126 to 0.0739 eV. Therefore, the electron mobility μ 0 , effective electron drift mobility μ e , as well as Fermi level energy E f , and trapping energy have also been determined.