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Structural and electronic analysis of Hf on Si(111) surface studied by angle-scanned photoelectron diffraction
Structural and electronic analysis of Hf on Si(111) surface studied by angle-scanned photoelectron diffraction
2006
Marcelo Falsarella Carazzolle
M. Schuermann
C. Fluechter
D. Weier
Carsten Westphal
U. Berges
A. de Siervo
Richard Landers
George G. Kleiman
Keywords:
Materials science
Photoelectric effect
Silicon
Electron diffraction
Diffraction
Electronic structure
Analytical chemistry
Scattering
Semimetal
Thin film
Correction
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