Energetic distribution of interface states extracted from photo-conductance of organic thin film transistors

Abstract In this paper, a new method is introduced to obtain the energetic distribution of the interface states (density of states; DOS) extracted from the photo-conductance of organic thin film transistors (OTFTs) which exhibit varied transfer characteristics under illumination with different photon energies. The method was applied to pentacene OTFTs, and the results were compared with existing data. The major findings were not only the existence of the well-known peaks of DOS at 1.82 eV (free exciton of pentacene), and at 1.49 eV (extrinsic exciton due to dihydropentacene) but also new peaks were found at 1.25 eV, 1.29 eV, 1.31 eV, and 1.35 eV in the mid-gap. The new peaks were strongly enhanced under exposure to oxygen, and thus seem to be related to the defects associated with the presence of oxygen.