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Deformation of the interlayer Van der Waals surface of the layered semiconductor crystals
Deformation of the interlayer Van der Waals surface of the layered semiconductor crystals
2013
A. M. Pashaev
B. G. Tagiev
R. A. Ibragimov
A.A. Safarzade
Keywords:
Crystallographic defect
Anisotropy
Atomic force microscopy
Semiconductor
Materials science
Microscopy
Van der Waals surface
Deformation (meteorology)
Condensed matter physics
Crystal structure
Correction
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