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Statistically Reliable EBSD Analysis Method of Grain Boundary Characterization
Statistically Reliable EBSD Analysis Method of Grain Boundary Characterization
2008
D. H. Kim
J.Y. Kang
D. I. Kim
Eun Kyu Her
S. J. Kim
H N Han
K.M. Oh
H.-C. Lee
Keywords:
Single crystal
Crystallography
Electron backscatter diffraction
Grain boundary
Materials science
analysis method
plane strain compression
Composite material
Correction
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