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Critical thickness measurements in vapor-deposited Pentaerythritol Tetranitrate (PETN) films.
Critical thickness measurements in vapor-deposited Pentaerythritol Tetranitrate (PETN) films.
2010
Michael P. Marquez
Robert Knepper
Ryan R. Wixom
Alexander S. Tappan
James Patrick Ball
Jill C. Miller
Keywords:
Pentaerythritol tetranitrate
Forensic engineering
Engineering
Composite material
Structural engineering
critical thickness
Materials science
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