A Physics-based Approach to Model Hot-Electron trapping kinetics in p-GaN HEMTs

Hot electron trapping can significantly modify the performance of GaN-based HEMTs during hard switching operation. In this paper, we present a physics-based model based on rate equations to model the trapping kinetics of hot-electrons in GaN transistors submitted to semi-ON-state stress. The model is validated through comparison with the experimental data, obtained by means of a pulsed-drain current transient setup developed ad-hoc. Hot-electron trapping is found to have logarithmic time dependence; the first 10 μs of operation are critical in determining the current collapse during stress.