Muon capture through bonding electrons in pure silicon

The muonic x-ray intensities of the Lyman series in pure silicon are investigated. The fitted data are compatible with a statistical initial angular momentum distribution of the captured muons. From a comparison with data measured in diamond, cubic boron nitride and in the two isoelectronic series F/sup -/,Ne,Na/sup +/ and Cl/sup -/,Ar,K/sup +/, we conclude that the calculated muon distribution reflects the symmetry of the electrons through which muon capture proceeds.