A kind of color depth characterizing method based on spectral reflectance and CIE color specification systems

The present invention proposes a kind of color depth characterizing method based on spectral reflectance and CIE color specification systems, and a kind of objective, continuous, quantitative characterizing method theoretical based on color science is provided to colour the color depth of thing.Spectral reflectance measurement data of the present invention according to coloring thing, utilize the standard colorimetric observer of CIE color specification systems, the color depth of coloring thing is calculated by new formula, available for the color depth of the coloring thing such as dyed fabric, dye strength/power part, color fastness, dyeability（Such as lifting force, Migration Index）Sign and evaluation.The technology of the present invention and its application are related to spectrophotometry, colourity technology, colorant production and the field such as dye technology, textile printing and dyeing process technology.