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A reference-scan-based method for correcting the nonlinear drift of atomic force microscopy at sub-nanometer precision
A reference-scan-based method for correcting the nonlinear drift of atomic force microscopy at sub-nanometer precision
2020
Ryosuke Kizu
Ichiko Misumi
Akiko Hirai
Satoshi Gonda
Keywords:
Atomic force microscopy
Nonlinear system
Optics
Nanometre
Physics
Correction
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