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Investigations of Materials for Ultra-Thin Window X-Ray Detectors
Investigations of Materials for Ultra-Thin Window X-Ray Detectors
1990
T. H. Markert
Mark L. Schattenburg
Ti Isobe
Johannes M. Bauer
Claude R. Canizares
James T. O’Connor
John Edward Porter
Henry I. Smith
Keywords:
Analytical chemistry
Materials science
X-ray detector
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