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Probing the homogeneity of an In-rich InGaN layer by nanoscale cathodoluminescence (Conference Presentation)
Probing the homogeneity of an In-rich InGaN layer by nanoscale cathodoluminescence (Conference Presentation)
2019
Bowen Sheng
Xiantong Zheng
Gordon Schmidt
Peter Veit
Ping Wang
F. Bertram
Zhaoying Chen
J. Christen
Bo Shen
Xinqiang Wang
Keywords:
Optoelectronics
Homogeneity (statistics)
Nanoscopic scale
Cathodoluminescence
Materials science
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