Passivation and etching of fine-grained polycrystalline silicon films by hydrogen treatment

Abstract Here we investigated the effects of hydrogen treatment on highly defected polycrystalline silicon solar cells in terms of defects passivation and surface etching. The poly-Si films were formed by high-temperature chemical vapour deposition. The hydrogen treatment was carried out through deposition of a-SiN x :H layer followed by a thermal treatment or by direct hydrogen plasma. The deposition of silicon nitride layers on polysilicon cells led to a slight increase in the open-circuit voltage without damage to the surface. In contrast, after plasma hydrogenation, the results revealed an etching process of the emitter simultaneously with an important increase of the measured open-circuit voltage by a factor 2, reaching 420 mV.