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DLTS studies of interface states for SiO 2 /n-GaN deposited by different methods
DLTS studies of interface states for SiO 2 /n-GaN deposited by different methods
2019
Kazuya Tamura
Yutaka Tokuda
Takashi Okawa
Hidemoto Tomita
Keywords:
Materials science
Optoelectronics
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