Multi-wavelength study of PPDs using an OPO tunable pulse laser microscope system

Abstract We have developed a new pulsed laser microscope system whose wavelength is continuously tunable from 410 nm to 2200 nm by using an optical parametric oscillator (OPO) laser system. The laser spot can be focused to ∼ 2 μ m diameter, small enough to measure pixel-by-pixel performance of PPDs (pixelated photon detectors). Using multi-wavelength laser light, we plan to probe PPDs at various depths, thanks to their different penetration lengths in the silicon layer. In this paper, details of the commissioning of the laser microscope system and pilot measurements on a PPD at several wavelengths will be presented.