Old Web
English
Sign In
Acemap
>
Paper
>
Anomalous thickness dependence of quality factor in TiN film resonators grown on functionalized Si substrates
Anomalous thickness dependence of quality factor in TiN film resonators grown on functionalized Si substrates
2016
Peng Xu
Tim Kohler
Evgeniya H. Lock
Yaniv Rosen
Aruna Ramanayaka
Samaresh Guchhait
Kevin Osborn
Keywords:
Resonator
Optoelectronics
Tin
Inorganic chemistry
Materials science
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]