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二次イオン質量分析法(SIMS)によるチタン中微量酸素の局所定量分析
二次イオン質量分析法(SIMS)によるチタン中微量酸素の局所定量分析
1995
takesita hiroyuki
tomii youiti
suzuki ryousuke
ono katutosi
Keywords:
Ion beam deposition
Secondary ion mass spectrometry
Materials science
Titanium
Quantitative analysis (chemistry)
Energy profile
Inorganic chemistry
Secondary Ion Mass Spectroscopy
Analytical chemistry
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