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Microstructure of the deep level defect E1/E2 in 6H silicon carbide
Microstructure of the deep level defect E1/E2 in 6H silicon carbide
2004
Charlotte Ling
X.D. Chen
Mingyang Gong
Keywords:
Microstructure
Deep-level transient spectroscopy
Metallurgy
Silicon carbide
Electron beam processing
Materials science
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