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In Situ Diffuse Reflectance Spectroscopy for Measurement and Control of III-V Molecular Beam Epitaxy
In Situ Diffuse Reflectance Spectroscopy for Measurement and Control of III-V Molecular Beam Epitaxy
2000
Jonathan E. Guyer
W. F. Tseng
W.R. Thurber
Eric M. Vogel
Monica D. Edelstein
Donald A. Gajewski
Joseph G. Pellegrino
Keywords:
Diffuse reflectance infrared fourier transform
Molecular beam epitaxy
Analytical chemistry
Materials science
In situ
Correction
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