A method of determining and correcting the response stability of a matrix detector has semiconductor

The general field of the invention is that the control methods of the response stability of a matrix display semiconductor pixelized. Said method comprises a first phase of pixels of the stability of characterization and a second phase correction signals from the pixels during the measurements. A characteristic of the method according to the invention is that the pixels are classified into pixels stable and unstable pixels according to a predetermined criterion, unstable pixels being individually associated with a stable pixel whose characteristics are employed as correction basis of signals from the pixels unstable .