TEM characterization of magnetic Sm- and Co-nanocrystals in SiC

This paper presents analytical TEM characterization of magnetic Sm- and Co-nanocrystals buried in SiC. High resolution TEM has been applied to analyse the lattice structure and crystallography of the nanocrystals: Lorentz microscopy has been applied to study their magnetic properties on the nanometre scale, revealing single-domain ferromagnetic structures.