Method for measuring off-axis aspheric surface eccentricity by laser tracker

The invention discloses a method for measuring off-axis aspheric surface eccentricity by a laser tracker, relates to a method for accurately controlling eccentricity in a manufacturing process of optical off-axis aspheric surfaces, and solves problems that existing methods are low in precision and reliability in optical surface detection, incapable of realizing measurement of large-caliber elements, and incapable of measuring off-axis aspheric surface eccentricity. The method includes utilizing the laser tracker to measure information of a reference surface of a compensator and calculating to acquire reference data of an optical axis; and utilizing the laser tracker to measure information of a reference surface of a to-be-measured spheric surface and calculating to acquire real-time data of an aspheric surface center; and finally comparing the real-time data to the reference of the optical axis to obtain eccentricity data. The method is easy to operate, simple in data processing and good in universality.