Characterization on Percolation of Nanostructured Silver Films by the Topological Properties of Spectroscopic Ellipsometric Parameter Trajectories
2020
Silver (Ag) films with different nanostructures were prepared by electron beam evaporation and characterized by spectroscopic ellipsometry in combination with X-ray diffraction and field emission s...
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
37
References
0
Citations
NaN
KQI