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Characterization of radiation-induced SRAM and logic soft errors from 0.33V to 1.0V in 65nm CMOS
Characterization of radiation-induced SRAM and logic soft errors from 0.33V to 1.0V in 65nm CMOS
2014
Robert Pawlowski
Joseph Crop
Minki Cho
James W. Tschanz
Vivek De
Thomas D. Fairbanks
Heather Quinn
Shekhar Borkar
Patrick Chiang
Keywords:
Logic family
Logic probe
Electronic engineering
Integrated injection logic
Computer science
Resistor–transistor logic
CMOS
Depletion-load NMOS logic
Diode-or circuit
Pass transistor logic
Digital electronics
Logic gate
Correction
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