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Simultaneous measurement of noise and bias stress of organic transistor
Simultaneous measurement of noise and bias stress of organic transistor
2020
Satomi Hasegawa
Tomohide Ueno
Takashi Fukuda
Shizuo Tokito
Hiroyuki Matsui
Keywords:
Materials science
Noise
bias stress
Trap (computing)
Transistor
Acoustics
Correction
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