New limits on double electron capture of40Ca and180W

G. Angloher,M. Bauer,P. Bauer,I. Bavykina,A. Bento,C. Bucci,L. Canonica,C. Ciemniak,X Defay,G. Deuter,A. Erb,Franz von Feilitzsch,N. Ferreiro Iachellini,P. Gorla,A Gütlein,D. Hauff,P. Huff,C. Isaila,Josef Jochum,M. Kiefer,M. Kimmerle,H Kluck,H. Kraus,J.-C. Lanfranchi,J. Loebell,A. Münster,C. Pagliarone,F. Petricca,S. Pfister,W. Potzel,F. Probst,F. Reindl,S. Roth,K. Rottler,C. Sailer,K Schaffner,Jochen Schieck,J. Schmaler,S. Scholl,Stefan Schönert,W. Seidel,M. v. Sivers,Leo Stodolsky,C. Strandhagen,R. Strauss,A. Tanzke,V. Tretyak,H. H. Trinh Thi,C. Türkoǧlu,M. Uffinger,A. Ulrich,I. Usherov,S. Wawoczny,M. Willers,M. Wüstrich,A. Zöller

New limits on double electron capture of40Ca and180W

2016

We analyzed low-background data from the CRESST-II experiment with a total net exposure of 730 kg days to extract limits on double electron capture processes. We established new limits for 40Ca with y and y and for 180W with y and y at 90% CL. Depending on the process, these values improve the currently best limits by a factor of .

Keywords:

Electron capture
Atomic physics
Physics

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