Crack Growth in Single-Crystal Silicon

C. P. Chen,M. H. Leipold

Crack Growth in Single-Crystal Silicon

1986

C. P. Chen
M. H. Leipold

Crack growth in single-crystal silicon at room temperature in air was evaluated by double torsion (DT) load-relaxation method and monitored by acoustic emission (AE) technique.

Keywords:

Crack growth resistance curve
Single crystal
Crystallography
Acoustic emission
Fracture mechanics
Torsion (mechanics)
Crack tip opening displacement
Crack closure
Materials science
Fracture toughness
Silicon
Structural engineering
Composite material

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