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Enhanced NBTI Degradation by SMT in Short-Channel pMOSFET
Enhanced NBTI Degradation by SMT in Short-Channel pMOSFET
2007
Chen-Shuo Huang
Po-Tsun Liu
Peng-Soon Lim
Chi-Chun Chen
Hun-Jan Tao
Yuh-Jier Mii
Keywords:
Electronic engineering
Communication channel
Materials science
Optoelectronics
Degradation (geology)
Correction
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