Ablation of ionic crystals induced by capillary-discharge XUV laser
2011
Single crystals of two fluorides (LiF and CaF2) and a tungstate (PbWO4) were irradiated by nanosecond pulses of 46.9-
nm radiation provided by 10-Hz capillary-discharge Ne-like Ar laser (CDL). The damage threshold was determined in
LiF using the CDL beam focused by a Sc/Si multilayer-coated spherical mirror. Irradiated samples have been
investigated by Nomarski (DIC - Differential Interference Contrast) microscopy and optical (WLI - white light
intereferometry) profiler. After an exposure by a certain number of CDL pulses, an ablation rate can be calculated from
WLI measured depth of the crater created by the XUV ablation. Potential use of XUV ablation of ionic crystals in pulsed
laser deposition (PLD) of thin layers of such a particular material, which is difficult to ablate by conventional UV-Vis-
NIR lasers, is discussed in this contribution.
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