Robustness of potential-profile-tunable electron pump

We performed a robustness test of a potential-profile-tunable electron pump for various parameters. Tuning the entrance and exit gates, we measured a flat current plateau within the 2 μΑ/Α uncertainty for a ∼40 mV gate-voltage range at B ∼ −14 T. For changes of B-field, the 2-μΑ/Α plateau was obtained for −14 T < B < −12.7 T. The 2 μΑ/Α plateau was also observed in the overlapped exit-gate voltage range over ∼40 mV at T = 300 mK and 1.3 K. The robustness of the pumping demonstrates stable operation and a feasible way to construct parallel pumps.