Reversed LED (Light Emitting Diode) chip tester and test method

The invention relates to a reversed LED (Light Emitting Diode) chip tester which comprises a chip loading device, a chip test device and a light source collecting device. The chip test device comprises a probe. The chip loading device comprises a work disc for placing a reversed LED chip to be tested, and a shaft rotating device. The tester further comprises a supporting part, through which the work disc is connected with the shaft rotating device. A gap for accommodating the light source collecting device is reserved between the work disc and the shaft rotating device. The work disc is a transparent work disc. During a test, the light source collecting device is moved to the bottom of the work disc and collects light emitted by the reversed LED chip. The test method of the reversed LED chip comprises the following steps of: loading the chip; scanning the position; automatically aligning; testing; unloading the chip and the like. According to the invention, through improvement of normally installed LED chip tester combined with the test method provided by the invention, the reversed LED chip can be tested and accurate test results can be obtained, and spectral and dichroic ground in the chip stage for the reversed LED chip is provided.