Non-intrusive automatic compiler-guided reliability improvement of embedded applications under proton irradiation

A method is presented for automated improvement of embedded application reliability. The compilation process is guided using Genetic Algorithms and a Multi-Objective Optimization Approach (MOOGA). Even though modern compilers are not designed to generate reliable builds, they can be tuned to obtain compilations that improve their reliability, through simultaneous optimization of their fault coverage, execution time, and memory size. Experiments show that relevant reliability improvements can be obtained from efficient exploration of the compilation solutions space. Fault-injection simulation campaigns are performed to assess our proposal against different benchmarks and the results are assessed against a real ARM-based System on Chip under proton irradiation.